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Journal of Microelectronic Manufacturing
Metadata for this journal is being automatically enriched from connected scholarly data sources.
Journal information
- Publisher
- JommPublish
- Subjects
- 3D IC and TSV technologies · Advancements in Photolithography Techniques · Advancements in Semiconductor Devices and Circuit Design · device · Electric apparatus and materials. Electric circuits. Electric networks · Electronic Packaging and Soldering Technologies · Industrial Vision Systems and Defect Detection · integrated circuit · Manufacturing Process and Optimization · microelectronics · process · Production capacity. Manufacturing capacity · semiconductor manufacutring · Semiconductor materials and devices · simulation · VLSI and Analog Circuit Testing
- Country
- US
- Languages
- EN
- ISSN
- 2578-3769
- E-ISSN
- 2578-3769
- ISSN-L
- 2578-3769
- Open access
- Yes
- OA since
- 2018
- Publication years
- 2018–2025
- APC (summary)
- —
- Website
- Visit journal ↗
Journal Classification
Classification is derived from this journal’s 2024–2025 publications using the OpenAlex taxonomy.
- Classification
- Field / Subfield
- Primary Field
- Engineering
- Primary Subfield
- Electrical and Electronic Engineering
- Domain
- Physical Sciences
- Confidence
- High
- Publications classified
- 2
- Classification version
- OAJF Classification v1.1
APC records
- DOAJ · 2026
- No APC