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Metrology
Metadata for this journal is being automatically enriched from connected scholarly data sources.
Journal information
- Publisher
- MDPI
- Subjects
- Advanced Electrical Measurement Techniques · Advanced Measurement and Metrology Techniques · Advanced Sensor Technologies Research · Applied mathematics. Quantitative methods · cyberphysical systems · Electronic computers. Computer science · machine learning for metrology · Manufacturing Process and Optimization · measurement uncertainty in dynamic processes · metrology for sustainable manufacturing · Optical measurement and interference techniques · Scientific Measurement and Uncertainty Evaluation · Sensor Technology and Measurement Systems · Surface Roughness and Optical Measurements
- Country
- CH
- Languages
- EN
- ISSN
- —
- E-ISSN
- 2673-8244
- ISSN-L
- 2673-8244
- Open access
- Yes
- OA since
- 2021
- Publication years
- 2017–2026
- APC (summary)
- —
- Website
- —
Journal Classification
Classification is derived from this journal’s 2024–2025 publications using the OpenAlex taxonomy.
- Classification
- Field / Subfield
- Primary Field
- Engineering
- Primary Subfield
- Mechanical Engineering
- Domain
- Physical Sciences
- Confidence
- Medium
- Publications classified
- 125
- Classification version
- OAJF Classification v1.1
APC records
- OPENALEX · 2026
- 1,000 CHF
- DOAJ · 2026
- 1,000 CHF